Articles | Volume 7, issue 1
01 May 1988
 | 01 May 1988

A technique for viewing the same nannofossil specimen in light microscope and scanning electron microscope using standard preparation materials

Liam T. Gallagher

Cited articles

J. F., Laing: A specimen location technique for SEM strew mounts, Palaeontology, 17, 435-436, 1974.
S., Moshkovitz: A new method for observing the same nannofossil specimen both by light microscope and by scanning electron microscope and preservation of types, Israel J. Earth Sci., 23, 145-147, 1974.
S., Moshkovitz: New types of cover slip and mounting slide with a graticule for examination of the same small object both by the light microscope and the scanning electron microscope, Microscopica Acta, 80, 161-166, 1978.
K., Perch-Nielsen: Eine preparationstechnik zur untersuchung von nonnoplankton in Lichtmikroskop und im Elektronenmikroskop, Meddr. dansk geol. Foren., 17, 129-130, 1967.
H. R., Thierstein, H. E., Franz and P. H., Roth: Scanning electron and light microscopy of the same small object, Micropaleontology, 17, 501-502, 1971.